Instrument name | Scanning Probe Microscopy(SPM) |
Manufacturer | Bruker (Veeco company) |
Specifications | 1. Noise: <0.3 A MS in vertical (Z) dimension with vibration isolation 2. sample size: 10 um diameter; 5 um thick |
Function and applications | The Multimode V performs a full range of SPM techniques for surface characterization of properties like topography, elasticity, friction, adhesion, and electrical and magnetic fields. |
Accessories | STM, C-AFM, EFM, MFM |
Contacts: Haihua Wu | |
Contact number: 65881259 | |
E-mail: hhw@suda.edu.cn | |
Editor: Haihua Wu