Description: Each crystal material has its unique chemical composition, crystal structure of the cell size, particle type and its arrangement in the unit cell is not the same. Therefore, each crystal material has its own unique X-ray diffraction spectrum. The characteristics of the diffraction spectrum can be characterized by the relative strength of the spacing d and the position of diffraction line. The X-ray phase analysis is based on the position, intensity and quantity of the X-ray diffraction line.
Instrument name | X-ray Diffractometer |
Manufacturers | PANalytical |
Model | Empyrean |
Principal Specifications | 1 X-ray tubes: Cu ; power: 2~3 kW 2 Maximum working voltage: 60 kV Maximum working current: 50 mA 3 Goniometer: θ/θ 4 Detector: PIXcel3D |
Main function | Empyrean is unique in its ability to measure all sample types, such as powders、thin films、nanomaterials、solid objects, on a single instrument, without compromising data quality. It reveals detailed information about the chemical composition and crystallographic structure of natural and manufactured materials. |
Accessories | 1 Microdiffraction 2 TTK 450 temperature attachment 3 Thin film Module 4 Multi-purpose stage |
Contacts | He Xiaodie |
Contact number | 65884616 |
Edited By Xiao-Die He