Instrument name | Probe Station |
Model | M150 |
Manufacturer | Cascade Microtech. Inc. |
Specifications | 1.Wafer Chuck: Up to 4 inch 2.Temperature Control: From 25℃ to 300℃ 3. Amplification of Microscope: Optical 400 times 4. Leakage Current: ≤50 fA |
Function and applications | The probe station is widely used in the field of I-V/C-V measurments, device characterization, submicron probing, optoelectronic engineering tests and more. |
Accessories | Shock-absorbing Bracket |
Contacts: Wenchang Zhu | |
Contact number: 65881259 | |
E-mail: wczhu@suda.edu.cn | |
Editor: Wenchang Zhu