Name | Semiconductor Low Frequency Noise and Parameter Analyzer |
Manufacturer | Primarius |
Model | FS-Pro |
Hardware Specifications | DC IV - Bias range ±200 V / 1 A, 4 quadrants operation - Minimum current accuracy 30 fA, voltage accuracy 30 uV - Maximum output power 20 W CV - Build-in CV: DC bias range ±200 V, maximum bandwidth 10 kHz, measurement range 20 fF~1 mF - External LCR: DC bias range ±40 V, maximum bandwidth 20 Hz~10 MHz, measurement range 10 fF~10 mF Pulse IV - Bias range ±200 V / 3 A, maximum output power 480 W - Minimum current measurement accuracy 5 pA - Voltage measurement accuracy 30 uV, minimum pulse width 50 us Transient I V - Arbitrary waveform output - Maximum sample rate 1.8 MS/s, minimum time step 10 us 1/f Noise - Standard 100 kHz bandwidth, supporting RTN - Minimum frequency resolution 1 mHz, measuring down to 2e-28A2 /Hz and <10 s/bias - DUT minimum impedance: 500 Ω High precision & fast waveform generation/measurement kit - 2-channel, SMA interface - Fast IV test: ± 10 V voltage, maximum current 10 mA - SMU direct connection: Voltage input ± 25 V, maximum current 100 mA - Sampling rate 100 msa/s, minimum recommended pulse width 130 nS |
Applications | Ø Opto-electronic device and MEMS measurement Ø Advanced materials and device measurement Ø Non-destructive measurement and inspection Ø Ultra-low frequency noise measurement Ø Device reliability test Ø Device ultrashort pulse test |
Accessories | Capacitance test module |
Contact: Yanyun Liu | |
Tel. : 65883196 | |
E-mail: yyliu1@suda.edu.cn | |
Editor: Wenchang Zhu