题目：

Defect-Controlled Preparation of UiO-66 Metal�Organic Framework Thin Films with Molecular Sieving Capability

作者：

Caiqin Zhang,^[a]Yajing Zhao,^[a]Yali Li,^[a]Xuetong Zhang,^[b] Lifeng Chi,^[a]and Guang Lu*^[a]

单位：

^[a]Soochow University-Western University Joint Centre for Synchrotron Radiation Research and ^‡ Jiangsu Key Laboratory for Carbon-based Functional Materials & Devices, Institute of Functional Nano & Soft Materials (FUNSOM), Soochow University, Suzhou, Jiangsu 215123, P. R. China

^[b]Suzhou Institute of Nano-Tech and Nano-Bionics Chinese Academy of Sciences 398 Ruoshui Road, Suzhou Industrial Park, Suzhou 215123 (China)

摘要：

Metal�organic framework (MOF) UiO-66 thin films are solvothermally grown on conducting substrates. The as-synthesized MOF thin films are subsequently dried by a supercritical process or treated with polydimethylsiloxane (PDMS). The obtained UiO-66 thin films show excellent molecular sieving capability as confirmed by the electrochemical studies for redox-active species with different sizes

影响因子：

4.587

分区情况：

2区

链接：

http://dx.doi.org/10.1002/asia.201501079